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 AEGIS
SEMICONDUTORES LTDA.
A5N:1400.XXH
VOLTAGE RATINGS
Part Number VRRM , VR (V) rep. peak reverse voltage TJ = 0 to 125 OC A5N:1400.16 A5N:1400.18 A5N:1400.20 A5N:1400.22 1600 1800 2000 2200 Max. VRSM , VR (V) Max. non-rep. peak reverse voltage TJ = 25 to 125OC 1700 1900 2100 2300
TJ = -40 to 0OC 1600 1800 2000 2200
MAXIMUM ALLOWABLE RATINGS
PARAMETER TJ Junction Temperature Tstg Storage Temperature IF(AV) Max. Av. current @ Max. TC VALUE -40 to 125 -40 to 150 1400 70 3080 25.7 IFSM Max. Peak non-rep. surge current 26.9 KA 30.5 32 3300 3000 I t Max. I t capability 4651 4250 It
2 1/2 2 2
UNITS
O O
NOTES 180O half sine wave 50 Hz half cycle sine wave 60 Hz half cycle sine wave 50 Hz half cycle sine wave 60 Hz half cycle sine wave t = 10ms t = 8.3 ms Initial TJ = 125OC, rated VRRM applied after surge.
C C C
A
O
IF(RMS) Nom. RMS current
A
Initial TJ = 125OC, no voltage applied after surge.
Initial TJ = 125OC, rated VRRM applied after surge.
kA s t = 10ms t = 8.3 ms kA s
2 1/2
2
Initial TJ = 125OC, no voltage applied after surge.
2
Max. I t
2 1/2
capability
46510
Initial TJ = 125OC, no voltage applied after surge. for time tx = I t
2 1/2
It
*
1/2 tx .
(0.1 < tx < 10ms).
di/dt Max. Non-repetitive rate-ofrise current PGM Max. Peak gate power PG(AV) Max. Av. gate power +IGM Max. Peak gate current -VGM Max. Peak negative gate voltage F Mounting Force
1000
A/ms
TJ = 125O C, VD = VDRM , ITM = 1600A. Gate pulse: 20V, 20W, 10ms, 0.5ms rise time, Max. repetitive di/dt is aproximately 40% of non-repetitive value. tp < 5 ms tp < 5 ms Non lubricated threads
16 3.0 3 5 2500
W W A V N
AEGIS
SEMICONDUTORES LTDA.
A5N:1400.XXH
CHARACTERISTICS
PARAMETER VTM peak on-state voltage VT(TO)1 Low-level threshold VT(TO)2 High-level threshold rT1 Low-level resistance rT2 High-level resistance IL Latching current IH Holding current td Delay time MIN. ----------------TYP. 1.38 --------1000 100 0.5 MAX. UNITS 1.73 0.91 1.01 0.21 0.19 --600 1.9 mW mA mA ms ms V V TEST CONDITIONS Initial TJ = 25 OC, 50-60Hz half sine, I peak = 4398A. TJ = 125OC Av. power = V T(TO) * IT(AV) +rT * [IT(RMS)] Use low values for ITM < p rated IT(AV) TC = 25 C, 12V anode. Gate pulse: 10V, 20W, 100ms. TC = 25O C, 12V anode. Initial IT = 10A. TC = 25OC, VD = rated VDRM , 50A resistive load. Gate pulse: 10V, 20W, 10ms, 1ms rise time. TJ = 125OC, ITM = 500A, di/dt = 25A/ms, VR = 50V. dv/dt = 200 V/ms lin. To 80% rated VDRM . Gate: 0V, 100W. TJ = 125OC. Exp. to 100% or lin. To 80% V DRM , gate open.
O O
2
tq Turn-off time
---
---
200
dv/dt Critical rate-of-rise of off- 300 state voltage 600 IRM, IDM Peak reverse and offstate current IGT DC gate current to trigger VGT DC gate voltage to trigger VGD DC gate voltage not to trigger RthJC Thermal resistance, junction-to-case RthCS Thermal resistance, case-to-sink wt Weight Case Style ----75 -----------------
500 --40 200 100 1.4 1.1 ----------425 (15) TO-200AD
----100 --200 --3 0.25 0.023 0.025 0.025 0.01 ---
V/ms
Higher dv/dt values avaliable.
TJ = 125 C, Exp. To 67% VDRM , gate open. mA mA V V
O O
TJ = 125OC, Rated VRRM and VDRM , gate open. TC = -40 C TC = 25 C TC = -40 OC TC = 25OC TC = 25OC, Max. Value which will not trigger with rated V DRM anode-to-cathode.
O O
+12V anode-to-cathode. For recommended gate drive see "Gate Characteristics" figure.
C/W DC operation. C/W 180O sine wave, double side coolde.
O C/W 120 rectangular wave, double side cooled.
O
O
C/W Mtg. Surface smooth, flat and greased. -----
g(oz.) JEDEC
AEGIS
SEMICONDUTORES LTDA.
A5N:1400.XXH
Maximum Allowable Case Temperature
125
125
Maximum Allowable Case Temperature Maximum Allowable Case Temperature (C)
120 115 110 105 100 95 90 85 80 75 70 65
30 120 60 90 180 DC
Maximum Allowable Case Temperature (C)
120 115 110 105 100 95 90 85 80 75 70 65 60 0 200 400 600
*Sinusoidal waveform 30 60 90 120 180
60
*Rectangular waveform
800
1000
1200
1400
0
200
400
600
800
1000
1200
1400
Average Forward Current (A)
A1F:400.XXHY (Single Side Cooled) RthJ-hs(DC) = 0.09K/W A1F:400.XXHY (Single Side Cooled) RthJ-hs(DC) = 0.09K/W
Average Forward Current (A)
Fig. 1 - Current Ratings Characteristics
Fig. 2 - Current Ratings Characteristics
A1F:400.XXHY (Single Side Cooled) RthJ-hs(DC) = 0.09K/W
A1F:400.XXHY (Single Side Cooled) RthJ-hs(DC) = 0.09K/W
Maximum Average Forward Power Loss
40000
Maximum Average Forward Power Loss
28000
30
Maximum Average Forward Power Loss (W)
36000 32000 28000 24000 20000 16000 12000 8000 4000 0 0 500 1000 1500 2000 2500
Maximum Average Forward Power Loss (W)
30
24000 20000 16000
60
60
12000
90
90 120 180
8000 4000 0 0 500 1000 1500 2000 2500
120 180 DC
3000
3000
3500
*Sinusoidal waveform
*Rectangular waveform
Average Forward Current (A)
Average Forward Current (A)
Fig. 3 - On-state Power Loss Characteristics
Fig. 4 - On-state Power Loss Characteristics
AEGIS
SEMICONDUTORES LTDA.
A5N:1400.XXH
Transient Thermal Impedance ZthJC
Forward Voltage Drop
10000
10-1
Transient Thermal Impedance ZthJC (C/W)
Instantaneous Forward Current (A)
10-2
1000
125C
25C
100 0.5 1.0 1.5 2.0 2.5 3.0
10-3 10-3
10-2
10-1
100
101
Instantaneous Forward Voltage (V)
Time (s)
Fig. 5 - Forward Voltage Drop Characteristics
Fig. 6 - Transient Thermal Impedance ZthJC Characteristics
TO-200AD


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